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Contact Probe×精研 - List of Manufacturers, Suppliers, Companies and Products

Contact Probe Product List

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We will match the inspection conditions! Contact probe (custom-made)

We will match the inspection conditions! Contact probe (custom-made)

In semiconductor testing, probe cards and IC sockets are often custom-made. We solve issues that cannot be addressed with standard probe products.

We offer a one-sided movable probe as a standard probe in our catalog. However, when trying to match it to equipment used for electrical testing, it may not meet the specifications. We can suggest existing probes tailored to the products or equipment conditions you wish to test, but if there is no suitable probe available, we can manufacture a custom one. In addition to partially manufacturing new parts based on existing probes, we can also create all parts from scratch. Therefore, if you need a replacement or compatible probe due to the discontinuation of a probe manufactured by another company, we may be able to assist you. *For more details, please refer to the PDF document or feel free to contact us.*

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*

  • Other semiconductors

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I would like to know again "How to use contact probes" *Free materials are currently being offered.

I would like to know again "How to use contact probes" *Free materials are currently being offered.

A specialized manufacturer of contact probes explains! How to use and replace standard probes and both-end probes.

We would like to introduce the usage of the "Contact Probe" that we handle. The "Standard Contact Probe (Single-End Probe)" is basically used in pairs with a socket due to the ease of replacement and wiring. The general method of using a contact probe involves drilling a hole in the resin, embedding a socket (receptacle) in it, and connecting the lead wires for wiring. Finally, the contact probe is inserted into the socket to complete the setup. Additionally, our website also provides information on "How to Use a Double-End Contact Probe" and "Replacing a Double-End Probe." [Content Included] ■ How to Use the Standard Probe ■ How to Use the Double-End Probe ■ Replacing the Double-End Probe *For more details, please refer to the PDF materials or visit our website.

  • probe

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Contact probe

Contact probe

Contact probe, pitch 0.45mm and above, long lifespan, high quality, available for purchase from Misumi starting from one piece.

【Product Catalog】【Usage Instruction Materials】 Contact probes (also known as pogo pins or test probes) have been used for continuity testing of electronic components. Our company has over 30 years of experience as a specialized manufacturer of probe pins. The structure consists of a spring inside a tube, and the tip (the plunger) makes contact with the electrode being tested with the appropriate load by stroking. The product catalog offers a lineup of 15 types for each pitch (the spacing between probes). Each series has multiple tip shapes available. Our probe pins are manufactured in-house, from processing the parts to assembly. Therefore, we can produce custom specifications to meet various requirements. 【We also accept resin board processing】 In addition to providing probes, we also offer processing of the resin that secures the probes. Furthermore, we can provide the probes with sockets integrated into the board and wiring to connectors. We also accept requests for resin processing only, so please feel free to contact us. *For more details, please download the PDF or contact us.

  • Other electronic parts
  • Other FA equipment
  • Inspection fixture

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Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Narrow pitch contact probe (dual end pins) with P=0.4 or less.

Make contact by bringing one side of the plunger into contact with the electrodes or relay pins of the relay board! L=20mm to 1.5mm, φ1mm to φ0.1mm.

This is an introduction to our "Contact Probe (Dual Pin)" that we handle. We offer two types: one with movable plungers on both sides and one with a movable plunger on only one side. The sizes range from long and thick ones with an overall length of 20mm and a thickness of approximately φ1.0mm, to shorter and thinner ones with an overall length of L=1.5mm and a thickness of φ0.1mm. The tip shape can be selected similarly to standard contact probes. 【Features】 ■ Two types are available: one with movable plungers on both sides and one with a movable plunger on only one side ■ The tip shape can be selected similarly to standard contact probes ■ The plunger on one side makes contact with the electrode of the relay board ■ Wiring is also possible using enamel wire attached to metal terminals ■ When in use, 2 to 3 boards are utilized *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Other electronic parts
  • Inspection fixture

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Contact probes for semiconductor testing, IC sockets, probe cards

Contact probes for semiconductor testing, IC sockets, probe cards

Flexible design and manufacturing tailored to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring to inspection.

Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ▼ Contact Probes We offer not only standard products but also flexible solutions tailored to testing conditions. ▼ Probe Cards and IC Sockets We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suited to the inspection targets at low costs. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: High frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 ▼ Contact Probes - Reduces the hassle of replacement. Durable "rare metal probes." - Revised internal structure. "New bias probes" for stable resistance value measurement. ▼ IC Sockets - Non-magnetic sockets, high heat resistance sockets. ▼ Probe Cards - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.

  • Other semiconductors

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